CUED Publications database

Electronic structure and defects of high dielectric constant gate oxide La2Hf2O7

Liu, D and Tse, K and Robertson, J (2007) Electronic structure and defects of high dielectric constant gate oxide La2Hf2O7. APPL PHYS LETT, 90. -. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: WORK FUNCTION THIN-FILMS
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 18:26
Last Modified: 25 Jul 2016 07:56
DOI: 10.1063/1.2433031