CUED Publications database

Electronic structure and defects of high dielectric constant gate oxide La2Hf2O7

Liu, D and Tse, K and Robertson, J (2007) Electronic structure and defects of high dielectric constant gate oxide La2Hf2O7. APPL PHYS LETT, 90. -. ISSN 0003-6951

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: WORK FUNCTION THIN-FILMS
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:06
Last Modified: 31 Aug 2015 07:36
DOI: 10.1063/1.2433031