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A framework for assessing amorphous oxide semiconductor thin-film transistor passivation

Wager, JF and Hoshino, K and Sundholm, ES and Presley, RE and Ravichandran, R and Knutson, CC and Keszler, DA and Hoffman, RL and Mourey, DA and Robertson, J (2012) A framework for assessing amorphous oxide semiconductor thin-film transistor passivation. JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 20. pp. 589-595. ISSN 1071-0922

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Item Type: Article
Uncontrolled Keywords: oxide electronics thin-film transistors amorphous oxide semiconductors passivation interface states
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:44
Last Modified: 17 Mar 2014 15:02
DOI: 10.1002/jsid.120

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