Wager, JF and Hoshino, K and Sundholm, ES and Presley, RE and Ravichandran, R and Knutson, CC and Keszler, DA and Hoffman, RL and Mourey, DA and Robertson, J (2012) A framework for assessing amorphous oxide semiconductor thin-film transistor passivation. JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 20. pp. 589-595. ISSN 1071-0922
Full text not available from this repository.
| Item Type: | Article |
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| Uncontrolled Keywords: | oxide electronics thin-film transistors amorphous oxide semiconductors passivation interface states |
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| Subjects: | UNSPECIFIED |
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| Divisions: | UNSPECIFIED |
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| Depositing User: | Cron Job |
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| Date Deposited: | 14 Jan 2013 08:10 |
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| Last Modified: | 20 May 2013 01:33 |
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| DOI: | 10.1002/jsid.120 |
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