CUED Publications database

A framework for assessing amorphous oxide semiconductor thin-film transistor passivation

Wager, JF and Hoshino, K and Sundholm, ES and Presley, RE and Ravichandran, R and Knutson, CC and Keszler, DA and Hoffman, RL and Mourey, DA and Robertson, J (2012) A framework for assessing amorphous oxide semiconductor thin-film transistor passivation. JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 20. pp. 589-595. ISSN 1071-0922

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Item Type: Article
Uncontrolled Keywords: oxide electronics thin-film transistors amorphous oxide semiconductors passivation interface states
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 13:46
Last Modified: 27 Aug 2015 21:15
DOI: 10.1002/jsid.120