Wager, JF and Hoshino, K and Sundholm, ES and Presley, RE and Ravichandran, R and Knutson, CC and Keszler, DA and Hoffman, RL and Mourey, DA and Robertson, J (2012) A framework for assessing amorphous oxide semiconductor thin-film transistor passivation. JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, 20. pp. 589-595. ISSN 1071-0922
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|Item Type: ||Article|
|Uncontrolled Keywords: ||oxide electronics thin-film transistors amorphous oxide semiconductors passivation interface states|
|Depositing User: ||Cron Job|
|Date Deposited: ||14 Jan 2013 08:10|
|Last Modified: ||20 May 2013 01:33|
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