Pei, R and Velichko, A and Jiang, Y and Hong, Z and Katayama, M and Coombs, T (2008) High-precision digital lock-in measurements of critical current and AC loss in HTS 2G-Tapes. Proceedings of the SICE Annual Conference. pp. 3147-3150.Full text not available from this repository.
Application of High Temperature Superconducting (HTS) has been increasingly popular since the new superconducting materials were discovered. This paper presents a new high-precision digital lock-in measurement technique which is used for measuring critical current and AC loss of the 2nd Generation HTS tape. Using a lock-in amplifier and nano-voltage meter, we can resolve signals at nano-volt level, while using a specially designed compensation coil we can cancel out inductive by adjusting the coil inductance. Furthermore, a finer correction for the inductive component can be achieved by adjusting the reference phase of the lock-in amplifier. The critical current and AC loss measurement algorithms and hardware layout are described and analyzed, and results for both numerical and experimental data under varieties of frequencies are presented. © 2008 SICE.
|Divisions:||Div B > Electronics, Power & Energy Conversion|
|Depositing User:||Cron Job|
|Date Deposited:||09 Dec 2016 18:33|
|Last Modified:||23 Mar 2017 08:14|