CUED Publications database

A Stochastic Model for Electron Multiplication Charge-Coupled Devices - From Theory to Practice

Hirsch, M and Wareham, RJ and Martin-Fernandez, ML and Hobson, MP and Rolfe, DJ (2013) A Stochastic Model for Electron Multiplication Charge-Coupled Devices - From Theory to Practice. PLoS ONE, 8. ISSN 1932-6203

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Abstract

Electron multiplication charge-coupled devices (EMCCD) are widely used for photon counting experiments and measurements of low intensity light sources, and are extensively employed in biological fluorescence imaging applications. These devices have a complex statistical behaviour that is often not fully considered in the analysis of EMCCD data. Robust and optimal analysis of EMCCD images requires an understanding of their noise properties, in particular to exploit fully the advantages of Bayesian and maximum-likelihood analysis techniques, whose value is increasingly recognised in biological imaging for obtaining robust quantitative measurements from challenging data. To improve our own EMCCD analysis and as an effort to aid that of the wider bioimaging community, we present, explain and discuss a detailed physical model for EMCCD noise properties, giving a likelihood function for image counts in each pixel for a given incident intensity, and we explain how to measure the parameters for this model from various calibration images. © 2013 Hirsch et al.

Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div F > Signal Processing and Communications
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:20
Last Modified: 08 Dec 2014 02:28
DOI: 10.1371/journal.pone.0053671