Influence of the matrix properties on the performances of Er-doped Si nanoclusters light emitting devices

Irrera, A and Iacona, F and Franzò, G and Miritello, M and Lo Savio, R and Castagna, ME and Coffa, S and Priolo, F (2010) Influence of the matrix properties on the performances of Er-doped Si nanoclusters light emitting devices. Journal of Applied Physics, 107. ISSN 0021-8979

Abstract

We investigated the properties of light emitting devices whose active layer consists of Er-doped Si nanoclusters (nc) generated by thermal annealing of Er-doped SiO x layers prepared by magnetron cosputtering. Differently from a widely used technique such as plasma enhanced chemical vapor deposition, sputtering allows to synthesize Er-doped Si nc embedded in an almost stoichiometric oxide matrix, so as to deeply influence the electroluminescence properties of the devices. Relevant results include the need for an unexpected low Si excess for optimizing the device efficiency and, above all, the strong reduction of the influence of Auger de-excitation, which represents the main nonradiative path which limits the performances of such devices and their application in silicon nanophotonics. © 2010 American Institute of Physics.