CUED Publications database

Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Chuah, JH and Holburn, D Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope. Advances in OptoElectronics, 2011. pp. 1-7. ISSN 1687-563X (Unpublished)

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:29
Last Modified: 17 Mar 2014 15:00
DOI: 10.1155/2011/648487

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