CUED Publications database

Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Chuah, JH and Holburn, D Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope. Advances in OptoElectronics, 2011. pp. 1-7. ISSN 1687-563X (Unpublished)

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 13:58
Last Modified: 31 Jul 2015 03:34
DOI: 10.1155/2011/648487