CUED Publications database

Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Chuah, JH and Holburn, D Design of Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope. Advances in OptoElectronics, 2011. pp. 1-7. ISSN 1687-563X (Unpublished)

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 19:16
Last Modified: 31 Aug 2016 07:17
DOI: