CUED Publications database

Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Chuah, J and Holburn, D Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope. Microscopy and Microanalysis, 17. pp. 1212-1213. ISSN 1431-9276 (Unpublished)

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 16 Jul 2015 14:00
Last Modified: 05 Sep 2015 01:35
DOI: 10.1017/S1431927611006933