CUED Publications database

Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Chuah, J and Holburn, D Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope. Microscopy and Microanalysis, 17. pp. 1212-1213. ISSN 1431-9276 (Unpublished)

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Unnamed user with email sms67@cam.ac.uk
Date Deposited: 18 May 2016 19:03
Last Modified: 24 Aug 2016 02:03
DOI: