CUED Publications database

Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Chuah, J and Holburn, D Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope. Microscopy and Microanalysis, 17. pp. 1212-1213. ISSN 1431-9276 (Unpublished)

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 09 Dec 2016 18:25
Last Modified: 11 Dec 2016 02:33
DOI: