CUED Publications database

Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope

Chuah, J and Holburn, D Pixellated CMOS Photon Detector for Secondary Electron Detection in the Scanning Electron Microscope. Microscopy and Microanalysis, 17. pp. 1212-1213. ISSN 1431-9276 (Unpublished)

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:29
Last Modified: 17 Mar 2014 15:00
DOI: 10.1017/S1431927611006933