CUED Publications database

A Pixellated Solid State Approach to Secondary Electron Detection in the Scanning Electron Microscope

Holburn, DM and Chuah, JH A Pixellated Solid State Approach to Secondary Electron Detection in the Scanning Electron Microscope. In: 15th European Microscopy Congress, -- to -- pp. 119-120.. (Unpublished)

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 18 May 2016 19:30
Last Modified: 29 May 2016 00:18
DOI: