CUED Publications database

A Pixellated Solid State Approach to Secondary Electron Detection in the Scanning Electron Microscope

Holburn, DM and Chuah, JH A Pixellated Solid State Approach to Secondary Electron Detection in the Scanning Electron Microscope. In: 15th European Microscopy Congress, -- to -- pp. 119-120.. (Unpublished)

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 04 Feb 2015 23:27
Last Modified: 05 Feb 2015 01:47
DOI: