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Structural and optical characterization of vertical GaAs/GaP core-shell nanowires grown on Si substrates

Kang, JH and Gao, Q and Joyce, HJ and Kim, Y and Guo, Y and Xu, H and Zou, J and Zou, J and Fickenscher, MA and Smith, LM and Jackson, HE and Yarrison-Rice, JM and Tan, HH and Jagadish, C (2010) Structural and optical characterization of vertical GaAs/GaP core-shell nanowires grown on Si substrates. Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD. pp. 57-58.

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Abstract

GaAs nanowires were grown on Si (111) substrates. By coating a thin GaAs buffer layer on Si surface and using a two-temperature growth, the morphology and crystal structure of GaAs nanowires were dramatically improved. The strained GaAs/GaP core-shell nanowires, based on the improved GaAs nanowires with a shell thickness of 25 nm, showed a significant shift in emission energy of 260 meV from the unstrained GaAs nanowires. © 2010 IEEE.

Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:08
Last Modified: 03 Aug 2015 07:04
DOI: 10.1109/COMMAD.2010.5699778