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Characterisation of nanostructures via terahertz spectroscopy

Parkinson, P and Joyce, HJ and Xu, X and Gao, Q and Tan, HH and Jagadish, C and Herz, LM and Johnston, MB (2010) Characterisation of nanostructures via terahertz spectroscopy. Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD. pp. 23-24.

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We have used terahertz spectroscopy to measure the conductivity and time-resolved photoconductivity of a range of semiconducting nanostructures. This article focuses on our recent terahertz conductivity studies on semiconductor nanowires and single walled carbon nanotubes. © 2010 IEEE.

Item Type: Article
Depositing User: Cron job
Date Deposited: 16 Jul 2015 14:08
Last Modified: 25 Nov 2015 11:07
DOI: 10.1109/COMMAD.2010.5699756