Parkinson, P and Joyce, HJ and Xu, X and Gao, Q and Tan, HH and Jagadish, C and Herz, LM and Johnston, MB (2010) Characterisation of nanostructures via terahertz spectroscopy. Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD. pp. 23-24.Full text not available from this repository.
We have used terahertz spectroscopy to measure the conductivity and time-resolved photoconductivity of a range of semiconducting nanostructures. This article focuses on our recent terahertz conductivity studies on semiconductor nanowires and single walled carbon nanotubes. © 2010 IEEE.
|Divisions:||Div B > Solid State Electronics and Nanoscale Science|
|Depositing User:||Cron Job|
|Date Deposited:||15 Dec 2015 13:33|
|Last Modified:||04 May 2016 05:57|