CUED Publications database

Defects at Ge:GeO2 and Ge:MeOx interfaces

Li, H and Robertson, J (2013) Defects at Ge:GeO2 and Ge:MeOx interfaces. MICROELECTRONIC ENGINEERING, 109. pp. 244-249. ISSN 0167-9317

Full text not available from this repository.
Item Type: Article
Uncontrolled Keywords: Ge Ge:GeO2 interface Passivation Calculation
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 07 Mar 2014 11:46
Last Modified: 22 Sep 2014 01:09
DOI: 10.1016/j.mee.2013.03.111