Alexander, S and Chaji, GR and Dionne, JM and Church, C and Hamer, J and Nathan, A (2010) P-38: Unique electrical measurement technology for compensation, inspection, and process diagnostics of AMOLED HDTV. Digest of Technical Papers - SID International Symposium, 41 1. pp. 1356-1359. ISSN 0097-966X
Full text not available from this repository.Abstract
A unique measurement and compensation technology for AMOLED high definition television is presented. The technique electrically measures every TFT and OLED in the backplane, useful for inspection and diagnostics in the factory, and subsequent compensation of mura, TFT- and OLED-degradation. © 2010 SID.
| Item Type: | Article |
|---|---|
| Subjects: | UNSPECIFIED |
| Divisions: | Div B > Solid State Electronics and Nanoscale Science |
| Depositing User: | Cron Job |
| Date Deposited: | 17 Jul 2017 19:07 |
| Last Modified: | 22 May 2018 06:19 |
| DOI: |
