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THz-wave emission from inner I-V branches of intrinsic Josephson junctions in Bi<inf>2</inf>Sr<inf>2</inf>CaCu<inf>2</inf>O<inf>8+δ</inf>

Tsujimoto, M and Yamamoto, T and Delfanazari, K and Nakayama, R and Orita, N and Koike, T and Deguchi, K and Kashiwagi, T and Minami, H and Kadowaki, K (2012) THz-wave emission from inner I-V branches of intrinsic Josephson junctions in Bi<inf>2</inf>Sr<inf>2</inf>CaCu<inf>2</inf>O<inf>8+δ</inf>. Journal of Physics: Conference Series, 400. ISSN 1742-6588

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Abstract

We have observed emissions of intense, continuous and monochromatic EM waves at THz frequencies from intrinsic Josephson junctions in the single crystalline Bi2Sr2CaCu2O8+δ mesa structure, which take place deep inside the multiple branch structures of the current-voltage characteristics. We measured a rectangular groove-type mesa sample with a nearly square shape fabricated by focused ion beam milling. The detection of emitted THz-waves and the spectroscopic measurement by the FT-IR spectrometer for obtaining the radiation frequency were performed simultaneously during the current-voltage measurement. By sweeping the voltage on a particular branch, we have observed that the radiation frequency varied in a relatively wider range than expected from the conventional cavity resonance condition, and that the frequency obeys the ac Josephson relation, in which the Josephson frequency is universally proportional to the voltage. These experimental facts may provide us significant information to understand the mechanism of the THz-wave emission from intrinsic Josephson junctions in order to make use of them as useful THz sources for many practical applications. © Published under licence by IOP Publishing Ltd.

Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 19:00
Last Modified: 24 Nov 2020 08:52
DOI: 10.1088/1742-6596/400/2/022127