CUED Publications database

An Approach to Simultaneously Test Multiple Devices for High-Throughput Production of Thin-Film Electronics

Kumar, A and Flewitt, AJ (2016) An Approach to Simultaneously Test Multiple Devices for High-Throughput Production of Thin-Film Electronics. Journal of Display Technology, 12. pp. 240-246. ISSN 1551-319X

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Abstract

© 2015 IEEE. New generation of thin-film transistors (TFTs), where the active material is amorphous oxide, conjugated polymer, or small molecules, have the advantage of flexibility, high form factor, and large scale manufacturability through low cost processing techniques, e.g., roll-to-roll printing, screen printing. During high-throughput production using these techniques, the probability of defects being present increases with the speed of manufacturing and area of devices. Therefore a high-throughput and low cost testing technique is absolute essential to maintain high quality of final product. We report a Simultaneous Multiple Device Testing (SMuDT) approach which is up to 10 times faster and cost effective than conventional testing methods. The SMuDT approach was validated using circuit simulation and demonstrated by testing large scale indium gallium zinc oxide (IGZO) TFTs. A method to 'bin' the tested devices using Figure of Merit was established.

Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 19:11
Last Modified: 07 Sep 2017 01:44
DOI: