CUED Publications database

Evaluating femtosecond laser ablation of graphene on SiO<inf>2</inf>/Si substrate

Dong, T and Sparkes, M and Durkan, C and O'Neill, W (2016) Evaluating femtosecond laser ablation of graphene on SiO<inf>2</inf>/Si substrate. Journal of Laser Applications, 28. ISSN 1042-346X

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© 2016 Laser Institute of America. We demonstrate a uniform single layer micropattern of graphene on 300 nm thick SiO 2 on a Si substrate using a 1030 nm, 280 fs laser. The cutting process was conducted in air, the pattern defined through the motion of a high-precision translation stage. Approximately 1.6 μm wide graphene microchannels were cut with uniform widths and well defined edges. The ablation threshold of graphene was determined to be 66-120 mJ/cm 2 , at which the selective removal of graphene was achieved without damage to the SiO 2 /Si substrate. Scanning electron microscopy images revealed high quality cuts (standard deviation 40 nm) with little damage or re-deposition. Raman maps showed no discernible laser induced damage in the graphene within the ablation zone. Atomic force microscopy revealed an edge step height ranging from less than 2 to 10 nm, suggesting little removal of SiO 2 and no damage to the silicon (the central path showed sub ablation threshold swelling). The effect of the ultrafast laser on the surface potential at the cut edge has been measured and it showed a distinguishable boundary.

Item Type: Article
Divisions: Div E > Production Processes
Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 19:11
Last Modified: 19 Jun 2018 02:07