CUED Publications database

A parameterless line segment and elliptical arc detector with enhanced ellipse fitting

Pǎtrǎucean, V and Gurdjos, P and Von Gioi, RG (2012) A parameterless line segment and elliptical arc detector with enhanced ellipse fitting. In: UNSPECIFIED pp. 572-585..

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Abstract

We propose a combined line segment and elliptical arc detector, which formally guarantees the control of the number of false positives and requires no parameter tuning. The accuracy of the detected elliptical features is improved by using a novel non-iterative ellipse fitting technique, which merges the algebraic distance with the gradient orientation. The performance of the detector is evaluated on computer-generated images and on natural images. © 2012 Springer-Verlag.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div D > Construction Engineering
Depositing User: Cron Job
Date Deposited: 17 Jul 2017 19:34
Last Modified: 17 Aug 2017 01:25
DOI: