CUED Publications database

Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu2O Thin Films

Han, S and Flewitt, AJ (2017) Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu2O Thin Films. SCIENTIFIC REPORTS, 7. ISSN 2045-2322

Full text not available from this repository.
Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 05 Sep 2017 01:40
Last Modified: 01 Apr 2021 04:33
DOI: 10.1038/s41598-017-05893-x