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Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu2O Thin Films

Han, S and Flewitt, AJ (2017) Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu2O Thin Films. SCIENTIFIC REPORTS, 7. ISSN 2045-2322

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Item Type: Article
Subjects: UNSPECIFIED
Divisions: Div B > Solid State Electronics and Nanoscale Science
Depositing User: Cron Job
Date Deposited: 05 Sep 2017 01:40
Last Modified: 07 Sep 2017 01:47
DOI: