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Photoelectrical imaging and characterization of point contacts in pentacene thin-film transistors

Tsen, AW and Cicoira, F and Malliaras, GG and Park, J (2010) Photoelectrical imaging and characterization of point contacts in pentacene thin-film transistors. Applied Physics Letters, 97. ISSN 0003-6951

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Abstract

We report the spatially resolved electrical response of bottom-contact pentacene thin-film transistors to a scanning, focused laser. We find that pentacene films make point-like electrical contacts to the underlying gold electrodes and are able to image them with diffraction-limited resolution. We can further estimate the interfacial resistance associated with hole-injection at an individual point contact, and show that optical activation of one alone increases device current significantly. © 2010 American Institute of Physics.

Item Type: Article
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron Job
Date Deposited: 10 Sep 2017 20:11
Last Modified: 18 Mar 2021 05:21
DOI: 10.1063/1.3462914