CUED Publications database

Design of Feedback controllers and Topography Estimator for Dual Actuated Atomic Force Microscopy

Kuiper, S and Kunnappillil Madhusudhanan, A and Van den Hof, PMJ and Schitter, G (2010) Design of Feedback controllers and Topography Estimator for Dual Actuated Atomic Force Microscopy. In: 29th Benelux Meeting on Systems and Control, 2010-3-30 to 2010-4-1, Heeze, The Netherlands p. 202..

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Abstract

Atomic Force Microscopy (AFM) is an important tool in nanotechnology, providing sample topography images with molecular resolution by probing the sample with a very sharp tip. One major drawback of AFM, however, is its relatively low imaging speed which makes it impossible to capture dynamic processes on a molecular scale. The goal of this research it to increase the imaging speed of AFM systems by using modern control techniques and improving the overall mechatronic design of these instruments.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: Div C > Biomechanics
Depositing User: Cron Job
Date Deposited: 28 Nov 2017 01:45
Last Modified: 15 Dec 2020 02:02
DOI: