CUED Publications database

On the Application of a Numerical Model to Improve the Accuracy of the Seebeck Coefficient in CMOS Materials

Falco, C and Udrea, F and IEEE, (2017) On the Application of a Numerical Model to Improve the Accuracy of the Seebeck Coefficient in CMOS Materials. In: UNSPECIFIED pp. 100-102..

Full text not available from this repository.
Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: UNSPECIFIED
Divisions: UNSPECIFIED
Depositing User: Cron Job
Date Deposited: 12 Nov 2018 20:11
Last Modified: 18 Feb 2021 15:24
DOI: